IEEE Computer Society - Guest Editors’ Introduction: Critical and Enabling Techniques for Emerging Memories

Author(s): Yiran Chen ; Tei-Wei Kuo ; Barbara de Salvo
Publisher: IEEE Computer Society
Publication Date: 1 June 2017
Volume: 34
Page(s): 6 - 7
ISSN (Paper): 2168-2356
ISSN (Online): 2168-2364
DOI: 10.1109/MDAT.2017.2682253
Regular:

The severe concerns about continuous scaling of mainstream memories motivated recent globalwise research on emerging memory technologies. Many promising characteristics, i.e., high integration... View More

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