IEEE Computer Society - Reliable Nonvolatile Memories: Techniques and Measures

Author(s): Shivam Swami ; Kartik Mohanram
Publisher: IEEE Computer Society
Publication Date: 1 June 2017
Volume: 34
Page(s): 31 - 41
ISSN (Paper): 2168-2356
ISSN (Online): 2168-2364
DOI: 10.1109/MDAT.2017.2682252

Editor's note: Reliability continues to be a severe challenge in the development of emerging memories. In this article, the authors offer a comprehensive survey of reliability enhancement... View More