IEEE - Institute of Electrical and Electronics Engineers, Inc. - Resolution degradation in X-ray detectors based on superconducting tunnel junctions

Author(s): R. Den Hartog ; P. Verhoeve ; A. Peacock ; A. Poelaert ; N. Rando
Sponsor(s): Council on Superconductivity
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 1999
Volume: 9
Page Count: 4
Page(s): 4,495 - 4,498
ISSN (Paper): 1051-8223
ISSN (Online): 1558-2515
DOI: 10.1109/77.784024
Regular:

Despite considerable progress over the past years, the detection of medium-energy X-ray photons (E>1 keV) with STJs near the energy-resolution limit, set by the Fano and tunnel noise, remains... View More

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