IEEE - Institute of Electrical and Electronics Engineers, Inc. - Void fraction effect on AC loss in saturation regime for NbTi CIC conductor

Author(s): B. Baudouy ; C. Berenguer ; M. Takeda ; J. Miller ; S.W. Van Sciver
Sponsor(s): Council on Superconductivity
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 1999
Volume: 9
Page Count: 4
Page(s): 567 - 570
ISSN (Paper): 1051-8223
ISSN (Online): 1558-2515
DOI: 10.1109/77.783359
Regular:

A superfluid helium calorimetric technique (the underlying principle of the NHMFL TACL Facility) was used to perform AC loss measurements on NbTi cable-in-conduit conductor samples. AC loss tests... View More

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