IEEE - Institute of Electrical and Electronics Engineers, Inc. - Influence of Microscopic Electric Field Enhancement on Microparticle Impact Phenomena Based on Fractal Modeling

Author(s): Yingyao Zhang ; Xinye Xu ; Lijun Jin ; Zhenlian An ; Yingsan Geng ; Jianhua Wang
Sponsor(s): IEEE Nuclear and Plasma Sciences Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1 - 8
ISSN (Electronic): 1939-9375
ISSN (Paper): 0093-3813
DOI: 10.1109/TPS.2017.2727542
Regular:

The objective of this paper is to study the influence of microscopic electric field enhancement caused by microprotrusions on microparticle impact phenomena based on fractal modeling. In this... View More

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