IEC - International Electrotechnical Commission - IEC TR 63133:2017
Semiconductor devices - Scan based ageing level estimation for semiconductor devices
published
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| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 11 October 2017 |
| Status: | published |
| Page Count: | 17 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
abstract:
IEC TR 63133:2017(E) specifies a design technique of performance estimation storage element, which can monitor semiconductor ageing and characterize ageing level. The estimated ageing level can be... View More
Document History
IEC TR 63133:2017
October 11, 2017
Semiconductor devices - Scan based ageing level estimation for semiconductor devices
IEC TR 63133:2017(E) specifies a design technique of performance estimation storage element, which can monitor semiconductor ageing and characterize ageing level. The estimated ageing level can be...