IEEE - Institute of Electrical and Electronics Engineers, Inc. - SAR interferometry on a very long time scale: a study of the interferometric characteristics of man-made features

Author(s): S. Usai ; R. Klees
Sponsor(s): IEEE Geoscience and Remote Sensing Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 1999
Volume: 37
Page Count: 6
Page(s): 2,118 - 2,123
ISSN (Paper): 0196-2892
ISSN (Online): 1558-0644
DOI: 10.1109/36.774730
Regular:

Anthropogenic features show up as highly coherent objects even in heavily decorrelated interferograms. In order to assess whether the information from such features is still usable, the stability... View More

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