IEEE - Institute of Electrical and Electronics Engineers, Inc. - Challenges in testing core-based system ICs

Author(s): E.J. Marinissen ; Y. Zorian
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 1999
Volume: 37
Page Count: 6
Page(s): 104 - 109
ISSN (Paper): 0163-6804
DOI: 10.1109/35.769283
Regular:

Advances in semiconductor design and manufacturing technology enable the design of complete systems on one IC. To develop these system ICs in a timely manner, traditional IC design in which... View More

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