IEEE - Institute of Electrical and Electronics Engineers, Inc. - A solution to the next best view problem for automated surface acquisition

Author(s): R. Pito
Sponsor(s): IEEE Computer Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 1999
Volume: 21
Page Count: 15
Page(s): 1,016 - 1,030
ISSN (CD): 2160-9292
ISSN (Paper): 0162-8828
DOI: 10.1109/34.799908
Regular:

A solution to the "next best view" (NBV) problem for automated surface acquisition is presented. The NBV problem is to determine which areas of a scanner's viewing volume need to be scanned to... View More

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