IEEE - Institute of Electrical and Electronics Engineers, Inc. - In-situ investigation of patterned magnetic domain structures using magnetic force microscope

Author(s): J.C. Wu ; H.W. Huang ; Y.W. Huang ; Te-Ho Wu
Sponsor(s): IEEE Magnetics Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 1999
Volume: 35
Page Count: 3
Page(s): 3,481 - 3,483
ISSN (Paper): 0018-9464
ISSN (Online): 1941-0069
DOI: 10.1109/20.800564
Regular:

A novel method for in-situ investigation of patterned magnetic domain structures is presented. Micron-length scales of permalloy thin film fabricated by a lift-off process using electron beam... View More

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