IEEE - Institute of Electrical and Electronics Engineers, Inc. - A new robust method for six-port reflectometer calibration

Author(s): F. Wiedmann ; B. Huyart ; E. Bergeault ; L. Jallet
Sponsor(s): IEEE Instrumentation and Measurement Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 1999
Volume: 48
Page Count: 5
Page(s): 927 - 931
ISSN (Paper): 0018-9456
ISSN (Online): 1557-9662
DOI: 10.1109/19.799649
Regular:

A new robust method for finding the parameters of Engen's six-port-to-four-port reduction algorithm for six-port reflectometer calibration has been developed. Like other previously... View More

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