IEEE - Institute of Electrical and Electronics Engineers, Inc. - A built-in current sensor based on current-mode design

Author(s): Kuen-Jong Lee ; Jing-Jou Tang
Sponsor(s): IEEE Circuits & Syst. Soc.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1998
Volume: 45
Page Count: 5
Page(s): 133 - 137
ISSN (Paper): 1057-7130
DOI: 10.1109/82.659464
Regular:

A very simple yet powerful design of a built-in current sensor for CMOS I/sub DDQ/ testing is presented. Compared with previous methods, this design has lower sensitivity to parameter deviation... View More

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