IEEE - Institute of Electrical and Electronics Engineers, Inc. - Microwave characterization and modeling of the surface impedance of fractal structure copper films

Author(s): E. Troncet ; G. Ablart ; L. Allam
Sponsor(s): IEEE Antennas and Propagation Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 1998
Volume: 46
Page Count: 8
Page(s): 434 - 441
ISSN (Paper): 0018-926X
ISSN (Online): 1558-2221
DOI: 10.1109/8.662663
Regular:

The surface impedances of two thin metallic films of different fractal structures realized on printed circuits have been measured in free-space over the frequency range [10 GHz-20 GHz]. A modeling... View More

Advertisement