IEEE - Institute of Electrical and Electronics Engineers, Inc. - High-spatial resolution reflectometry by synthesis of optical coherence function for measuring reflectivity distribution at a long distance

Author(s): T. Saida ; K. Hotate
Sponsor(s): IEEE Lasers and Electro-Optics Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 1998
Volume: 10
Page(s): 573 - 575
ISSN (Electronic): 1941-0174
ISSN (Paper): 1041-1135
DOI: 10.1109/68.662598
Regular:

A high-spatial resolution reflectometry by synthesis of the optical coherence function is proposed for testing optical devices and circuits at the far end of optical subscriber networks. The... View More

Advertisement