IEEE - Institute of Electrical and Electronics Engineers, Inc. - High-spatial resolution reflectometry by synthesis of optical coherence function for measuring reflectivity distribution at a long distance
Author(s): | T. Saida ; K. Hotate |
Sponsor(s): | IEEE Lasers and Electro-Optics Society |
Publisher: | IEEE - Institute of Electrical and Electronics Engineers, Inc. |
Publication Date: | 1 April 1998 |
Volume: | 10 |
Page(s): | 573 - 575 |
ISSN (Electronic): | 1941-0174 |
ISSN (Paper): | 1041-1135 |
DOI: | 10.1109/68.662598 |
Regular:
A high-spatial resolution reflectometry by synthesis of the optical coherence function is proposed for testing optical devices and circuits at the far end of optical subscriber networks. The... View More