IEEE - Institute of Electrical and Electronics Engineers, Inc. - Multiobjective scheduling for IC sort and test with a simulation testbed

Author(s): Jian Yang ; Tsu-Shuan Chang
Sponsor(s): IEEE Electron Devices Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 1998
Volume: 11
Page Count: 12
Page(s): 304 - 315
ISSN (Paper): 0894-6507
ISSN (Online): 1558-2345
DOI: 10.1109/66.670181
Regular:

In manufacturing environments such as an integrated circuit (IC) sort and test floor, typically more than one objective, such as cycle time and on-time delivery, needs to be simultaneously... View More

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