IEEE Computer Society - Effective built-in self test for Booth multipliers

Author(s): D. Gizopoulos ; A. Paschalis ; Y. Zorian
Sponsor(s): IEEE Computer Society
Publisher: IEEE Computer Society
Publication Date: 1 July 1998
Volume: 15
Page Count: 7
Page(s): 105 - 111
ISSN (Paper): 0740-7475
DOI: 10.1109/54.706041
Regular:

Booth multipliers, widely used as embedded cores in general-purpose data path structures and specialized digital signal processors, pose serious testability problems. This generic BIST scheme does... View More

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