IEEE - Institute of Electrical and Electronics Engineers, Inc. - Elimination of birefringence induced scale factor errors in the in-line Sagnac interferometer current sensor

Author(s): S.X. Short ; J.U. De Arruda ; A.A. Tselikov ; J.N. Blake
Sponsor(s): IEEE Lasers and Electro-Optics Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 1998
Volume: 16
Page Count: 7
Page(s): 1,844 - 1,850
ISSN (Paper): 0733-8724
ISSN (Online): 1558-2213
DOI: 10.1109/50.721071
Regular:

This paper presents theoretical and experimental results showing the effects of linear and circular birefringence on the sensing coil of an in-line Sagnac interferometer current sensor. Linear... View More

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