IEC - International Electrotechnical Commission - IEC 60749-1:2002/COR1:2003
Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 1: General
published
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| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 12 August 2003 |
| Status: | published |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
abstract:
Modification of the validity date: now put at 2007.
Document History
IEC 60749-1:2002/COR1:2003
August 12, 2003
Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 1: General
Modification of the validity date: now put at 2007.
August 30, 2002
Semiconductor devices - Mechanical and climatic test methods - Part 1: General
Applicable to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all the other parts of the series. The contents of the corrigendum of August 2003...