IEC - International Electrotechnical Commission - IEC TS 62878-2-4:2015
Device embedded substrate - Part 2-4: Guidelines - Test element groups (TEG)
published
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| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 27 March 2015 |
| Status: | published |
| Page Count: | 75 |
| ICS Code (Printed circuits and boards): | 31.180 |
| ICS Code (Electronic component assemblies): | 31.190 |
abstract:
IEC TS 62878-2-4:2015 describes the test element group devices useful when measuring basic properties of device embedded substrates. It is applicable to device embedded substrates fabricated by... View More
Document History
IEC TS 62878-2-4:2015
March 27, 2015
Device embedded substrate - Part 2-4: Guidelines - Test element groups (TEG)
IEC TS 62878-2-4:2015 describes the test element group devices useful when measuring basic properties of device embedded substrates. It is applicable to device embedded substrates fabricated by use...