IEC - International Electrotechnical Commission - IEC 60512-16-1:2008

Connectors for electronic equipment - Tests and measurements - Part 16-1: Mechanical tests on contacts and terminations - Test 16a: Probe damage

published
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Organization: IEC - International Electrotechnical Commission
Publication Date: 11 June 2008
Status: published
Page Count: 12
ICS Code (Plug-and-socket devices. Connectors): 31.220.10
abstract:

IEC 60512-16-1:2008 details a standard test method to assess the effectiveness of the elastic system of contacts to resist damage from the insertion of a specified test probe.

Document History

IEC 60512-16-1:2008
June 11, 2008
Connectors for electronic equipment - Tests and measurements - Part 16-1: Mechanical tests on contacts and terminations - Test 16a: Probe damage
IEC 60512-16-1:2008 details a standard test method to assess the effectiveness of the elastic system of contacts to resist damage from the insertion of a specified test probe.
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