IEC - International Electrotechnical Commission - IEC 62779-2:2016
Semiconductor devices - Semiconductor interface for human body communication - Part 2: Characterization of interfacing performances
published
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| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 18 February 2016 |
| Status: | published |
| Page Count: | 33 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
abstract:
IEC 62779-2:2016 defines a measurement method on electrical performances of an electrode that composes a semiconductor interface for human body communication (HBC). In the measurement method, a... View More
Document History
IEC 62779-2:2016
February 18, 2016
Semiconductor devices - Semiconductor interface for human body communication - Part 2: Characterization of interfacing performances
IEC 62779-2:2016 defines a measurement method on electrical performances of an electrode that composes a semiconductor interface for human body communication (HBC). In the measurement method, a...