IEC - International Electrotechnical Commission - IEC 63003:2015
Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505™
published
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| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 14 December 2015 |
| Status: | published |
| Page Count: | 162 |
| ICS Code (Industrial automation systems in general): | 25.040.01 |
abstract:
IEC 63003:2015(E) the scope is the definition of a pin map utilizing the IEEE 1505 receiver fixture interface (RFI). The pin map defined within this standard shall apply to military and aerospace... View More
Document History
IEC 63003:2015
December 14, 2015
Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505™
IEC 63003:2015(E) the scope is the definition of a pin map utilizing the IEEE 1505 receiver fixture interface (RFI). The pin map defined within this standard shall apply to military and aerospace...