IEC - International Electrotechnical Commission - IEC TR 62878-2-2:2015
Device embedded substrate - Part 2-2: Guidelines - Electrical testing
published
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| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 4 December 2015 |
| Status: | published |
| Page Count: | 29 |
| ICS Code (Printed circuits and boards): | 31.180 |
| ICS Code (Electronic component assemblies): | 31.190 |
abstract:
IEC TR 62878-2-2:2015 describes the necessary information on electrical testing for device embedded substrate. This includes the interconnection open- and short-circuit tests as well as the device... View More
Document History
IEC TR 62878-2-2:2015
December 4, 2015
Device embedded substrate - Part 2-2: Guidelines - Electrical testing
IEC TR 62878-2-2:2015 describes the necessary information on electrical testing for device embedded substrate. This includes the interconnection open- and short-circuit tests as well as the device...