IEC - International Electrotechnical Commission - IEC 62373:2006
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
published
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| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 18 July 2006 |
| Status: | published |
| Page Count: | 27 |
| ICS Code (Transistors): | 31.080.30 |
abstract:
Provides a test procedure for a bias-temperature (BT) stability test of metal-oxide semiconductor, field-effect transistors (MOSFET)
Document History
IEC 62373:2006
July 18, 2006
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
Provides a test procedure for a bias-temperature (BT) stability test of metal-oxide semiconductor, field-effect transistors (MOSFET)