IEC - International Electrotechnical Commission - IEC TS 61945:2000
Interated circuits - Manufacturing line approval - Methodology for technology and failure analysis
published
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| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 10 March 2000 |
| Status: | published |
| Page Count: | 23 |
| ICS Code (Integrated circuits. Microelectronics): | 31.200 |
abstract:
Gives the methodology for technology and failure analysis in manufacturing integrated circuits. Technology analysis is used to determine the way a component is built by observing it using adequate... View More
Document History
IEC TS 61945:2000
March 10, 2000
Interated circuits - Manufacturing line approval - Methodology for technology and failure analysis
Gives the methodology for technology and failure analysis in manufacturing integrated circuits. Technology analysis is used to determine the way a component is built by observing it using adequate...