IEC - International Electrotechnical Commission - IEC 60444-2:1980
Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units
published
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| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 1 January 1980 |
| Status: | published |
| Page Count: | 18 |
| ICS Code (Piezoelectric devices): | 31.140 |
abstract:
Describes a method of measuring the motional capacitance of quartz crystal units in the frequency range 1 MHz to 125 MHz with a total measurement error of the order of 5%.
Document History
IEC 60444-2:1980
January 1, 1980
Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units
Describes a method of measuring the motional capacitance of quartz crystal units in the frequency range 1 MHz to 125 MHz with a total measurement error of the order of 5%.