IEC - International Electrotechnical Commission - IEC 62047-6:2009

Semiconductor devices - Micro-electromechanical devices - Part 6: Axial fatigue testing methods of thin film materials

published
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Organization: IEC - International Electrotechnical Commission
Publication Date: 7 April 2009
Status: published
Page Count: 30
ICS Code (Other semiconductor devices): 31.080.99
abstract:

IEC 62047-6:2009 specifies the method for axial tensile-tensile force fatigue testing of thin film materials with a length and width under 1 mm and a thickness in the range between 0,1 µm and 10... View More

Document History

IEC 62047-6:2009
April 7, 2009
Semiconductor devices - Micro-electromechanical devices - Part 6: Axial fatigue testing methods of thin film materials
IEC 62047-6:2009 specifies the method for axial tensile-tensile force fatigue testing of thin film materials with a length and width under 1 mm and a thickness in the range between 0,1 µm and 10 µm...
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