IEC - International Electrotechnical Commission - IEC 61000-4-14:1999/AMD2:2009
Amendment 2 - Electromagnetic compatibility (EMC) - Part 4-14: Testing and measurement techniques - Voltage fluctuation immunity test for equipment with input current not exceeding 16 A per phase
published
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| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 13 May 2009 |
| Status: | published |
| Page Count: | 10 |
| ICS Code (Immunity): | 33.100.20 |
Document History
August 12, 2009
Electromagnetic compatibility (EMC) - Part 4-14: Testing and measurement techniques - Voltage fluctuation immunity test for equipment with input current not exceeding 16 A per phase
IEC 61000-4-14:1999+A1:2001+A2:2009 applies to electrical and/or electronic equipment that have a rated input current up to 16 A per phase. Aims to establish a reference for evaluating the immunity...
IEC 61000-4-14:1999/AMD2:2009
May 13, 2009
Amendment 2 - Electromagnetic compatibility (EMC) - Part 4-14: Testing and measurement techniques - Voltage fluctuation immunity test for equipment with input current not exceeding 16 A per phase
A description is not available for this item.
July 8, 2002
Electromagnetic compatibility (EMC) - Part 4-14: Testing and measurement techniques - Voltage fluctuation immunity test
Applies to electrical and/or electronic equipment that have a rated input current up to 16 A per phase. Aims to establish a reference for evaluating the immunity of electric and/or electronic...
July 11, 2001
Amendment 1 - Electromagnetic compatibility (EMC) - Part 4-14: Testing and measurement techniques - Voltage fluctuation immunity test
Subclause 8.1 (Climatic conditions) and clause 9 (Evaluation of test results) have been amended. Contains a new clause 10 (Test report).
February 23, 1999
Electromagnetic compatibility (EMC) - Part 4-14: Testing and measurement techniques - Voltage fluctuation immunity test
Applies to electrical and/or electronic equipment that have a rated input current up to 16 A per phase. Aims to establish a reference for evaluating the immunity of electric and/or electronic...