IEC - International Electrotechnical Commission - IEC 60512-25-3:2001
Connectors for electronic equipment - Tests and measurements - Part 25-3: Test 25c - Rise time degradation
published
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| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 26 July 2001 |
| Status: | published |
| Page Count: | 23 |
| ICS Code (Plug-and-socket devices. Connectors): | 31.220.10 |
abstract:
Describes a method for measuring the effect a specimen has on the rise time of a signal passing through it.
Document History
IEC 60512-25-3:2001
July 26, 2001
Connectors for electronic equipment - Tests and measurements - Part 25-3: Test 25c - Rise time degradation
Describes a method for measuring the effect a specimen has on the rise time of a signal passing through it.