IEC - International Electrotechnical Commission - IEC 60748-11-1:1992
Semiconductor devices - Integrated circuits - Part 11-1: Internal visual examination for semiconductor integrated circuits excluding hybrid circuits
published
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| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 1 April 1992 |
| Status: | published |
| Page Count: | 71 |
| ICS Code (Integrated circuits. Microelectronics): | 31.200 |
abstract:
The purpose of these tests is to check the internal materials, construction and workmanship of integrated circuits for compliance with the requirements of the applicable specification.
Document History
IEC 60748-11-1:1992
April 1, 1992
Semiconductor devices - Integrated circuits - Part 11-1: Internal visual examination for semiconductor integrated circuits excluding hybrid circuits
The purpose of these tests is to check the internal materials, construction and workmanship of integrated circuits for compliance with the requirements of the applicable specification.