IEC - International Electrotechnical Commission - IEC 62047-7:2011
Semiconductor devices - Micro-electromechanical devices - Part 7: MEMS BAW filter and duplexer for radio frequency control and selection
published
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| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 16 June 2011 |
| Status: | published |
| Page Count: | 56 |
| ICS Code (Other semiconductor devices): | 31.080.99 |
abstract:
IEC 62047-7:2011 describes terms, definition, symbols, configurations, and test methods that can be used to evaluate and determine the performance characteristics of BAW resonator, filter, and... View More
Document History
IEC 62047-7:2011
June 16, 2011
Semiconductor devices - Micro-electromechanical devices - Part 7: MEMS BAW filter and duplexer for radio frequency control and selection
IEC 62047-7:2011 describes terms, definition, symbols, configurations, and test methods that can be used to evaluate and determine the performance characteristics of BAW resonator, filter, and...