IEC - International Electrotechnical Commission - IEC 62132-2:2010
Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method
published
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| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 30 March 2010 |
| Status: | published |
| Page Count: | 49 |
| ICS Code (Integrated circuits. Microelectronics): | 31.200 |
abstract:
IEC 62132-2:2010 specifies a method for measuring the immunity of an integrated circuit (IC) to radio frequency (RF) radiated electromagnetic disturbances. The frequency range of this method is... View More
Document History
IEC 62132-2:2010
March 30, 2010
Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method
IEC 62132-2:2010 specifies a method for measuring the immunity of an integrated circuit (IC) to radio frequency (RF) radiated electromagnetic disturbances. The frequency range of this method is from...