IEC - International Electrotechnical Commission - IEC 62415:2010
Semiconductor devices - Constant current electromigration test
published
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| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 19 May 2010 |
| Status: | published |
| Page Count: | 22 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
abstract:
IEC 62415:2010 describes a method for conventional constant current electromigration testing of metal lines, via string and contacts.
Document History
IEC 62415:2010
May 19, 2010
Semiconductor devices - Constant current electromigration test
IEC 62415:2010 describes a method for conventional constant current electromigration testing of metal lines, via string and contacts.