IEC - International Electrotechnical Commission - IEC 60749-36:2003
Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state
published
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| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 13 February 2003 |
| Status: | published |
| Page Count: | 7 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
abstract:
Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices. It is an accelerated test designed to indicate types of structural and mechanical... View More
Document History
IEC 60749-36:2003
February 13, 2003
Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state
Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices. It is an accelerated test designed to indicate types of structural and mechanical weaknesses...