IEC - International Electrotechnical Commission - IEC 60749-31:2002
Semiconductor devices - Mechanical and climatic test methods - Part 31: Flammability of plastic-encapsulated devices (internally induced)
published
Buy Now
| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 30 August 2002 |
| Status: | published |
| Page Count: | 9 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
abstract:
Applicable to semiconductor devices (discrete devices and integrated circuits), this test determines whether the device ignites due to internal heating caused by excessive overloads.
The... View More
Document History
August 13, 2003
Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 31: Flammability of plastic-encapsulated devices (internally induced)
Modification of the validity date: now put at 2007.
IEC 60749-31:2002
August 30, 2002
Semiconductor devices - Mechanical and climatic test methods - Part 31: Flammability of plastic-encapsulated devices (internally induced)
Applicable to semiconductor devices (discrete devices and integrated circuits), this test determines whether the device ignites due to internal heating caused by excessive overloads. The contents of...