IEC - International Electrotechnical Commission - IEC 60749-1:2002
Semiconductor devices - Mechanical and climatic test methods - Part 1: General
published
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| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 30 August 2002 |
| Status: | published |
| Page Count: | 15 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
abstract:
Applicable to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all the other parts of the series.
The contents of the corrigendum of... View More
Document History
August 12, 2003
Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 1: General
Modification of the validity date: now put at 2007.
IEC 60749-1:2002
August 30, 2002
Semiconductor devices - Mechanical and climatic test methods - Part 1: General
Applicable to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all the other parts of the series. The contents of the corrigendum of August 2003...