IEC - International Electrotechnical Commission - IEC 60749-12:2002
Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency
revised
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| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 30 April 2002 |
| Status: | revised |
| Page Count: | 7 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
abstract:
Describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It is normally... View More
Document History
December 13, 2017
Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency
IEC 60749-12:2017 describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It is...
August 13, 2003
Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency
A description is not available for this item.
IEC 60749-12:2002
April 30, 2002
Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency
Describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It is normally applicable...