IEC - International Electrotechnical Commission - IEC 60749-27:2006+AMD1:2012 CSV
Semiconductor devices - Mechanical and climatic test methods - Part27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
published
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| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 25 September 2012 |
| Status: | published |
| Page Count: | 25 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
abstract:
IEC 60749-27:2006+A1:201
Document History
September 25, 2012
Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
A description is not available for this item.
IEC 60749-27:2006+AMD1:2012 CSV
September 25, 2012
Semiconductor devices - Mechanical and climatic test methods - Part27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
IEC 60749-27:2006+A1:2012 Establishes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined...
July 18, 2006
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
Establishes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined machine model (MM) electrostatic...
October 21, 2003
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
Establishes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined machine model electrostatic...