IEC 61445
Digital Test Interchange Format (DTIF)
Organization: | IEC |
Publication Date: | 1 June 2012 |
Status: | active |
Page Count: | 112 |
ICS Code (Languages used in information technology): | 35.060 |
ICS Code (Industrial automation systems): | 25.040 |
scope:
This standard deÞnes the information content and the data formats for the interchange of digital test program data between DATPGs and automatic test equipment (ATE) for board-level printed circuit assemblies. This information can be broadly grouped into data that deÞnes the following:
a) UUT Model;
b) Stimulus and Response;
c) Fault Dictionary;
d) Probe.
Purpose
The purpose of this standard is to provide a standard output format for test data generated by a DATPG. A DATPG produces test patterns and fault diagnostic data for ATE. This data is used in applications such as board-level assemblies where diagnostic data interchange is important.