IEC - International Electrotechnical Commission - IEC 60512-25-6:2004
Connectors for electronic equipment - Tests and measurements - Part 25-6: Test 25f: Eye pattern and jitter
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| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 26 May 2004 |
| Status: | published |
| Page Count: | 35 |
| ICS Code (Plug-and-socket devices. Connectors): | 31.220.10 |
abstract:
Describes methods for measuring an eye pattern response and jitter in the time domain.
Document History
IEC 60512-25-6:2004
May 26, 2004
Connectors for electronic equipment - Tests and measurements - Part 25-6: Test 25f: Eye pattern and jitter
Describes methods for measuring an eye pattern response and jitter in the time domain.