IEC - International Electrotechnical Commission - IEC 60749-33:2004

Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance - Unbiased autoclave

published
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Organization: IEC - International Electrotechnical Commission
Publication Date: 9 March 2004
Status: published
Page Count: 6
ICS Code (Semiconductor devices in general): 31.080.01
abstract:

The unbiased autoclave test is performed to evaluate the moisture resistance integrity of non-hermetically packaged solid-state devices using moisture condensing or moisture saturated steam... View More

Document History

IEC 60749-33:2004
March 9, 2004
Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance - Unbiased autoclave
The unbiased autoclave test is performed to evaluate the moisture resistance integrity of non-hermetically packaged solid-state devices using moisture condensing or moisture saturated steam...
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