IEC - International Electrotechnical Commission - IEC 60831-2:1995

Shunt power capacitors of the self-healing type for a.c. systems having a rated voltage up to and including 1000 V - Part 2: Ageing test, self-healing test and destruction test

revised
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Organization: IEC - International Electrotechnical Commission
Publication Date: 8 December 1995
Status: revised
Page Count: 21
ICS Code (Other electrical accessories): 29.120.99
ICS Code (Power capacitors): 31.060.70
abstract:

Applies to capacitors according to IEC 60831-1 and gives the requirements for ageing test, self-healing test and destruction test for these capacitors.

Document History

February 12, 2014
Shunt power capacitors of the self-healing type for a.c. systems having a rated voltage up to and including 1 000 V - Part 2: Ageing test, self-healing test and destruction test
IEC 60831-2:2014 applies to capacitors according to IEC 60831-1 and gives the requirements for the ageing test, self-healing test and destruction test for these capacitors. This third edition cancels...
IEC 60831-2:1995
December 8, 1995
Shunt power capacitors of the self-healing type for a.c. systems having a rated voltage up to and including 1000 V - Part 2: Ageing test, self-healing test and destruction test
Applies to capacitors according to IEC 60831-1 and gives the requirements for ageing test, self-healing test and destruction test for these capacitors.
Amendment 2 - Shunt power capacitors of the self-healing type for a.c. systems having a rated voltage up to and including 660 V - Part 2: Ageing test, self-healing test and destruction test
A description is not available for this item.
Amendment 1 - Shunt power capacitors of the self-healing type for a.c. systems having a rated voltage up to and including 660 V - Part 2: Ageing test, self-healing test and destruction test
A description is not available for this item.
January 1, 1988
Shunt power capacitors of the self-healing type for a.c. systems having a rated voltage up to and including 660 V - Part 2: Ageing test, self-healing test and destruction test
A description is not available for this item.
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