IEC - International Electrotechnical Commission - IEC PAS 62175:2000
Marking permanency test method
replaced
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| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 24 August 2000 |
| Status: | replaced |
| Page Count: | 5 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
abstract:
Verifies that the markings on solid state semiconductor devices will not become illegible when subjected to solvents or cleaning solutions commonly used during the removal of solder flux residue... View More
Document History
IEC PAS 62175:2000
August 24, 2000
Marking permanency test method
Verifies that the markings on solid state semiconductor devices will not become illegible when subjected to solvents or cleaning solutions commonly used during the removal of solder flux residue from...