IEC - International Electrotechnical Commission - IEC PAS 62178:2000
Temperature cycling
replaced
Buy Now
| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 22 August 2000 |
| Status: | replaced |
| Page Count: | 6 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
abstract:
This test is conducted to determine the resistance of a part to extremes of high- and low-temperatures and to the effect of alternate exposures to these extremes.
Document History
IEC PAS 62178:2000
August 22, 2000
Temperature cycling
This test is conducted to determine the resistance of a part to extremes of high- and low-temperatures and to the effect of alternate exposures to these extremes.