IEC - International Electrotechnical Commission - IEC PAS 62186:2000
Mechanical shock test method
replaced
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| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 24 August 2000 |
| Status: | replaced |
| Page Count: | 3 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
abstract:
This test is intended to determine the suitability of component parts for use in electronic equipment which may be subjected to moderately severe shocks as a result of suddenly applied forces or... View More
Document History
IEC PAS 62186:2000
August 24, 2000
Mechanical shock test method
This test is intended to determine the suitability of component parts for use in electronic equipment which may be subjected to moderately severe shocks as a result of suddenly applied forces or...