IEC - International Electrotechnical Commission - IEC PAS 62186:2000

Mechanical shock test method

replaced
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Organization: IEC - International Electrotechnical Commission
Publication Date: 24 August 2000
Status: replaced
Page Count: 3
ICS Code (Semiconductor devices in general): 31.080.01
abstract:

This test is intended to determine the suitability of component parts for use in electronic equipment which may be subjected to moderately severe shocks as a result of suddenly applied forces or... View More

Document History

IEC PAS 62186:2000
August 24, 2000
Mechanical shock test method
This test is intended to determine the suitability of component parts for use in electronic equipment which may be subjected to moderately severe shocks as a result of suddenly applied forces or...
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