IEC - International Electrotechnical Commission - IEC PAS 62187:2000
Variable frequency vibration test method
replaced
Buy Now
| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 24 August 2000 |
| Status: | replaced |
| Page Count: | 12 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
abstract:
The variable frequency vibration test is performed to determine the effect of vibration, within the specified frequency range, on the internal structural elements. Normally applicable to... View More
Document History
IEC PAS 62187:2000
August 24, 2000
Variable frequency vibration test method
The variable frequency vibration test is performed to determine the effect of vibration, within the specified frequency range, on the internal structural elements. Normally applicable to cavity-type...