IEC - International Electrotechnical Commission - IEC PAS 62173:2000

Solderability test method

replaced
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Organization: IEC - International Electrotechnical Commission
Publication Date: 22 August 2000
Status: replaced
Page Count: 17
ICS Code (Semiconductor devices in general): 31.080.01
abstract:

Provides a means of determining the solderability of device package terminations that are intended to be joined to another surface using solder for the attachment.

Provides also optional... View More

Document History

IEC PAS 62173:2000
August 22, 2000
Solderability test method
Provides a means of determining the solderability of device package terminations that are intended to be joined to another surface using solder for the attachment. Provides also optional conditions...
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