IEC - International Electrotechnical Commission - IEC PAS 62173:2000
Solderability test method
replaced
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| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 22 August 2000 |
| Status: | replaced |
| Page Count: | 17 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
abstract:
Provides a means of determining the solderability of device package terminations that are intended to be joined to another surface using solder for the attachment.
Provides also optional... View More
Document History
IEC PAS 62173:2000
August 22, 2000
Solderability test method
Provides a means of determining the solderability of device package terminations that are intended to be joined to another surface using solder for the attachment. Provides also optional conditions...