IEC - International Electrotechnical Commission - IEC 60512-10-4:1996
Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 10: Impact tests (free components), static load tests (fixed components), endurance tests and overload tests - Section 4: Test 10d: Electrical overload (connectors)
revised
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| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 10 May 1996 |
| Status: | revised |
| Page Count: | 9 |
| ICS Code (Plug-and-socket devices. Connectors): | 31.220.10 |
abstract:
Details a standard method to assess the performance of mated contact pairs of connectors with an electrical overload current flowing through them for a limited period of time.
Document History
August 11, 2003
Connectors for electronic equipment - Tests and measurements - Part 10-4: Impact tests (free components), static load tests (fixed components), endurance tests and overload tests - Test 10d: Electrical overload (connectors)
Draws up a standard method to assess the performance of mated contact pairs of connectors with an electrical overload current flowing through them for a limited period of time between 100 ms and 20...
IEC 60512-10-4:1996
May 10, 1996
Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 10: Impact tests (free components), static load tests (fixed components), endurance tests and overload tests - Section 4: Test 10d: Electrical overload (connectors)
Details a standard method to assess the performance of mated contact pairs of connectors with an electrical overload current flowing through them for a limited period of time.