IEC - International Electrotechnical Commission - IEC PAS 62205:2000
High temperature storage life
replaced
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| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 28 November 2000 |
| Status: | replaced |
| Page Count: | 3 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
abstract:
Aims at determining the effect on solid state electronic devices of storage at elevated temperature without electrical stress applied. This test is considered destructive.
Document History
IEC PAS 62205:2000
November 28, 2000
High temperature storage life
Aims at determining the effect on solid state electronic devices of storage at elevated temperature without electrical stress applied. This test is considered destructive.