IEC - International Electrotechnical Commission - IEC PAS 62204:2000
Standard method for measuring and using the temperature coefficient of resistance to determine the temperature of a metallization line
withdrawn
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| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 28 November 2000 |
| Status: | withdrawn |
| Page Count: | 25 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
abstract:
Aims at determining the temperature coefficient of resistance (at a given reference temperature) of aluminium and aluminium-alloy thin-film metallization that are used in microelectronic circuits... View More
Document History
IEC PAS 62204:2000
November 28, 2000
Standard method for measuring and using the temperature coefficient of resistance to determine the temperature of a metallization line
Aims at determining the temperature coefficient of resistance (at a given reference temperature) of aluminium and aluminium-alloy thin-film metallization that are used in microelectronic circuits and...